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AES and SEM studies of oxide and sulfide scales formed on sputter-deposited 304 stainless steel at 800 and 950 /sup 0/C

Journal Article · · J. Vac. Sci. Technol.; (United States)
DOI:https://doi.org/10.1116/1.571638· OSTI ID:5585069
High temperature (800--950 /sup 0/C) corrosion studies of fine-grained sputter-deposited 304 stainless steel have been conducted at low pressures (<10/sup -2/ Pa) in an Auger electron spectroscopy (AES) UHV chamber and compared with studies performed in an environment of mixed gases containing O and S. In situ surface analysis performed at low gas pressures has provided a detailed examination of the diffusion processes that occur during alloy corrosion. Oxide scales formed at 10/sup -2/ Pa O/sub 2/ on sputter-deposited fine-grained 304 stainless steel have been found to closely resemble those formed in mixed-gas environments at atmospheric pressure, suggesting that the same mechanisms are active in both situations. During initial oxidation at 10/sup -2/ Pa of Y-doped samples, a silicon oxide was observed by AES to form and then to be covered by a growing chromium oxide. This relates well to the silicon-rich oxide subscale found on similar samples following 24 h in the mixed-gas environment and suggests that the presence of Y affects Si mobility. In addition, the oxide scales on some samples exposed to the mixed gas were observed to be covered by FeS. In the AES system, exposure of oxidized samples to H/sub 2/S caused a sulfur layer to build on the surface which drew iron onto the oxide-scale surface faster than sulfur diffused into the oxide. This result implies that an FeS layer can form on the surface at an earlier stage of attack than previously thought and can be a significant aspect of the corrosion process.
Research Organization:
Pacific Northwest Laboratory, Richland, Washington 99352
OSTI ID:
5585069
Journal Information:
J. Vac. Sci. Technol.; (United States), Journal Name: J. Vac. Sci. Technol.; (United States) Vol. 20:4; ISSN JVSTA
Country of Publication:
United States
Language:
English