Thermal noise induced switching of Josephson logic devices

Journal Article · Wed Apr 14 23:00:00 EST 1982 · Appl. Phys. Lett.; (United States)

DOI:https://doi.org/10.1063/1.93213· OSTI ID:5582532

Klein, M; Mukherjee, A

Thermal noise induced switching of Josephson logic devices is studied, both theoretically and experimentally. The results are critical for the design of the operating bias points for these devices. An analysis of the relevant energy contours shows that a three-junction superconducting quantum interference device has the same noise switching rate as a point junction with the same maximum critical current. Experimental results, for the dependence of the thermal noise induced switching rate on the gate current bias ratio, are in very good agreement with the theory.

• Research Organization: IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598
• OSTI ID: 5582532
• Journal Information: Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 40:8; ISSN APPLA
• Country of Publication: United States
• Language: English

Related Subjects

420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CRITICAL CURRENT
CURRENTS
DATA
DESIGN
ELECTRIC CURRENTS
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
EQUIPMENT
EXPERIMENTAL DATA
FLUXMETERS
INFORMATION
JOSEPHSON JUNCTIONS
JUNCTIONS
LOGIC CIRCUITS
MATHEMATICAL MODELS
MEASURING INSTRUMENTS
MICROWAVE EQUIPMENT
NOISE
NUMERICAL DATA
SQUID DEVICES
SUPERCONDUCTING DEVICES
SUPERCONDUCTING JUNCTIONS
SWITCHING CIRCUITS
TEMPERATURE EFFECTS