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Emittance of the ORNL negative ion source

Technical Report ·
DOI:https://doi.org/10.2172/5577292· OSTI ID:5577292
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An electrostatic emittance scanner has been used to measure the emittance of intense H/sup -/ and D/sup -/ beams formed by ion sources developed at the Oak Ridge National Laboratory (ORNL). The ion sources have been operated reliably in both the Surface Ionization with Transverse Extraction (SITEX) and Volume Ionization with Transverse Extraction (VITEX) modes. The emittance measurements were made in a magnetic field of about 1 kg. The effective dimensions of the beamlet sample at the accelerator exit in the SITEX mode were 0.21 cm by 0.16 cm. (Here 0.16 cm is the central part of a 12.7-cm beam ribbon that is parallel to the applied source magnetic field.) The normalized rms emittances for such SITEX beamlets (approx.1.14 mA) were 0.01 ..pi.. . cm. mrad measured transverse to the field and 0.003 ..pi.. . cm . mrad measured parallel to the field for 10-keV D/sup -/ beams (36 mA/cm/sup 2/). The dimensions of H/sup -/ beams at the accelerator exit in the VITEX mode were 0.1 cm by 2.0 cm. The normalized rms emittances were about 0.013 ..pi.. . cm . mrad measured transverse to the field and 0.017 ..pi.. . cm . mrad measured parallel to the field for 15-keV, 12-mA (or 60-mA/cm/sup 2/) beams. The highest current density achieved is above 150 mA/cm/sup 2/. Ion temperatures obtained from the parallel emittance measurements were 9.4 eV for SITEX beams and 0.6 eV for VITEX beams. In this report, the method used to analyze the measured emittance data is described, and the potential errors in measurement are discussed. 9 refs., 16 figs., 1 tab.
Research Organization:
Oak Ridge National Lab., TN (USA)
DOE Contract Number:
AC05-84OR21400
OSTI ID:
5577292
Report Number(s):
ORNL/TM-10186; ON: DE88004763
Country of Publication:
United States
Language:
English

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71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ANGULAR DISTRIBUTION
BEAM CURRENTS
BEAM EMITTANCE
BEAMS
CHARGED PARTICLES
CURRENT DENSITY
CURRENTS
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DEUTERON BEAMS
DISTRIBUTION
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ION BEAMS
ION SOURCES
ION TEMPERATURE
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PHASE SPACE
SPACE