The structure and faceting behavior of tilt grain boundaries in aluminum
Conference
·
OSTI ID:5576612
This work describes a number of experimental observations on the structure and behavior of {Sigma}99 and other near-90{degree} <110> tilt boundaries in bicrystals of aluminum. The continuous bicrystal structure employed in these studies is based on the symmetry properties inherent in heteroepitaxial growth. A thin film grown in this geometry consists of intertwined grains surrounding each other but with only two grain orientations.
- Research Organization:
- Lawrence Berkeley Lab., CA (United States)
- Sponsoring Organization:
- DOE; USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 5576612
- Report Number(s):
- LBL-29942; CONF-9105328--1; ON: DE92010452
- Country of Publication:
- United States
- Language:
- English
Similar Records
The structure and faceting behavior of tilt grain boundaries in aluminum
TEM Characterization of Grain Boundaries in Mixed Bicrystal Films of Aluminum
Structure and morphology of nanosized lead inclusions in aluminum grain boundaries
Conference
·
Wed Oct 31 23:00:00 EST 1990
·
OSTI ID:10136351
TEM Characterization of Grain Boundaries in Mixed Bicrystal Films of Aluminum
Conference
·
Thu Feb 28 23:00:00 EST 1991
·
OSTI ID:5626271
Structure and morphology of nanosized lead inclusions in aluminum grain boundaries
Journal Article
·
Thu Oct 31 23:00:00 EST 1996
· Interface Science
·
OSTI ID:381798