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Title: Electronic structure of defects in oxides. Final report, December 1, 1980-November 30, 1981. [MgAl/sub 2/O/sub 4/]

Technical Report ·
OSTI ID:5562112

Details of the electronic structure of F-type centers and charge trapping in the series of oxides SrO, CaO, MgO, ..cap alpha..-Al/sub 2/O/sub 3/ and MgAl/sub 2/O/sub 4/ have been determined using photoconductivity, luminescence, and fluorescence lifetimes. Measurements were made over the spectral range 1.5 to 6.5 eV and over the temperature range 4 to 350 K. The centers were introduced into SrO by electron, proton or neutron bombardment, into CaO, MgO, and ..cap alpha..-Al/sub 2/O/sub 3/ by electron or neutron bombardment, or thermochemical reduction, and into MgAl/sub 2/O/sub 4/ by particle bombardment. In some cases, notably CaO, MgO, and ..cap alpha..-Al/sub 2/O/sub 3/ exhibit phosphorescence near room temperature, with the emission occurring at the wavelength corresponding to the F center. Our work suggests that the electron trap involved is H/sup -/ ions, but this has only so far been confirmed for MgO.

Research Organization:
Oklahoma State Univ., Stillwater (USA). Dept. of Physics
DOE Contract Number:
AS05-76ER04837
OSTI ID:
5562112
Report Number(s):
DOE/ER/04837-8; ORO-4837-8; ON: DE83018200
Resource Relation:
Other Information: Portions are illegible in microfiche products
Country of Publication:
United States
Language:
English