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APFIM study of antiphase and grain boundaries in Ni/sub 3/Al

Conference ·
OSTI ID:5542725
Ni/sub 3/Al is an ordered intermetallic material and is potentially useful for high temperature applications. Unlike most alloys the yield stress of Ni/sub 3/Al actually increases with an increase in temperature. Unfortunately, pure Ni/sub 3/Al exhibits a brittle intergranular fracture and, consequently, low ductility. However, doping Ni/sub 3/Al with boron improves the mechanical properties and can result in room temperature ductilities up to 50% and a completely transgranular failure. Auger electron spectroscopy (AES) has shown that boron segregates to those boundaries which can be made to fail intergranularly and that no embrittling agents are found on fracture surfaces of pure Ni/sub 3/Al. Atom probe field-ion microscopy (APFIM) is an excellent technique to study the structure and chemistry of ''good'' boundaries, especially for light elements such as boron. Results from this study have shown that boron segregates to both grain boundries and antiphase boundaries (APB) and that a thin phase is usually present at the grain boundaries in rapidly solidified Ni/sub 3/Al.
Research Organization:
Oak Ridge National Lab., TN (USA)
DOE Contract Number:
AC05-84OR21400
OSTI ID:
5542725
Report Number(s):
CONF-860829-4; ON: DE86008494
Country of Publication:
United States
Language:
English