Use of autodyne frequency converters based on gunn diodes for contactless measurements of dielectric parameters at shf
Journal Article
·
· Sov. J. Nondestr. Test. (Engl. Transl.); (United States)
OSTI ID:5534708
This paper shows how Gunn diodes operating in an autodyne, frequency-conversion mode can be used to measure the dielectric constant or the thickness of dielectric materials. The optimal measuring mode is also determined. Better frequency stability of the MES-diode oscillators and the use of precision signal generators will reduce correspondingly the lower limit for the thickness measurements.
- Research Organization:
- N.G. Chernshevskii Saratov State Univ.
- OSTI ID:
- 5534708
- Journal Information:
- Sov. J. Nondestr. Test. (Engl. Transl.); (United States), Journal Name: Sov. J. Nondestr. Test. (Engl. Transl.); (United States) Vol. 21:5; ISSN SJNTA
- Country of Publication:
- United States
- Language:
- English
Similar Records
Power combiner with Gunn diode oscillators
Terahertz oscillations in an In{sub 0.53}Ga{sub 0.47}As submicron planar Gunn diode
Model of stochastic self-oscillation in Gunn diode oscillators
Journal Article
·
Sat May 01 00:00:00 EDT 1982
· IEEE Trans. Microwave Theory Tech.; (United States)
·
OSTI ID:6984679
Terahertz oscillations in an In{sub 0.53}Ga{sub 0.47}As submicron planar Gunn diode
Journal Article
·
Fri Mar 21 00:00:00 EDT 2014
· Journal of Applied Physics
·
OSTI ID:22271219
Model of stochastic self-oscillation in Gunn diode oscillators
Journal Article
·
Wed Jul 01 00:00:00 EDT 1987
· Radiophys. Quantum Electron. (Engl. Transl.); (United States)
·
OSTI ID:5309324
Related Subjects
36 MATERIALS SCIENCE
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
COMPARATOR CIRCUITS
COUNTING CIRCUITS
DESIGN
DIELECTRIC MATERIALS
DIELECTRIC PROPERTIES
DIMENSIONS
ELECTRICAL PROPERTIES
ELECTRICAL TESTING
ELECTRONIC CIRCUITS
FREQUENCY CONVERTERS
MATERIALS
MATERIALS TESTING
MEASURING INSTRUMENTS
NONDESTRUCTIVE TESTING
PERFORMANCE
PHYSICAL PROPERTIES
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SENSITIVITY
TESTING
THICKNESS
THICKNESS GAGES
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
COMPARATOR CIRCUITS
COUNTING CIRCUITS
DESIGN
DIELECTRIC MATERIALS
DIELECTRIC PROPERTIES
DIMENSIONS
ELECTRICAL PROPERTIES
ELECTRICAL TESTING
ELECTRONIC CIRCUITS
FREQUENCY CONVERTERS
MATERIALS
MATERIALS TESTING
MEASURING INSTRUMENTS
NONDESTRUCTIVE TESTING
PERFORMANCE
PHYSICAL PROPERTIES
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SENSITIVITY
TESTING
THICKNESS
THICKNESS GAGES