Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Photoinduced hole-doping effect in (Y{sub 0.5}Ca{sub 0.5})Ba{sub 2}Cu{sub 3}O{sub {delta}} films

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.120323· OSTI ID:552946
; ; ; ;  [1]
  1. Department of Physics and Materials Science Center, National Tsing Hua University, Hsinchu, Taiwan 300, Republic of (China)

The persistent photoinduced changes in the critical temperature T{sub C} and the normal state conductivity of (Y{sub 0.5}Ca{sub 0.5})Ba{sub 2}Cu{sub 3}O{sub {delta}} thin films are studied. Previously such effects have been observed only in underdoped YBa{sub 2}Cu{sub 3}O{sub {delta}} or YSr{sub x}Ba{sub 2{minus}x}Cu{sub 3}O{sub {delta}}, which always lead to the enhancement of both T{sub C} and conductivity. The current system can be doped from the underdoped regime to the overdoped regime by increasing its oxygen content. The photoinduced T{sub C} reduction in the overdoped films is observed. The simultaneous enhancement of conductivity is consistent with the interpretation that photoillumination always increases hole concentration in the {open_quotes}123{close_quotes} systems. {copyright} {ital 1997 American Institute of Physics.}

OSTI ID:
552946
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 22 Vol. 71; ISSN 0003-6951; ISSN APPLAB
Country of Publication:
United States
Language:
English

Similar Records

Hole distribution in underdoped and overdoped Y(Ba{sub 2{minus}y}Sr{sub y})Cu{sub 3}O{sub 6+{delta}} compounds studied by X-ray absorption spectroscopy
Journal Article · Mon Oct 19 00:00:00 EDT 1998 · Inorganic Chemistry · OSTI ID:321102

Evolution of the Pseudogap State of High-{ital T{sub c}} Superconductors with Doping
Journal Article · Tue Oct 01 00:00:00 EDT 1996 · Physical Review Letters · OSTI ID:388366

Pinning enhancement and critical current densities in (Sm{sub 0.5}Y{sub 0.5})Ba{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} superconductor
Journal Article · Wed Sep 01 00:00:00 EDT 1999 · IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers) · OSTI ID:20000844