Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Why is CuInSe{sub 2} tolerant to defects and what is the origin of {open_quotes}Ordered Defect Structures{close_quotes}

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.52886· OSTI ID:552820
; ;  [1]
  1. National Renewable Energy Laboratory, Golden, Colorado 80401 (United States)

This paper explains both the (1) remarkable electronic passivity of CuInSe{sub 2} to its many structural defects, and (2) the occurance of previously noted but unexplained series of structures CuIn{sub 5}Se{sub 8}, CuIn{sub 3}Se{sub 5}, Cu{sub 2}In{sub 4}Se{sub 7}, etc. in terms of the unusual stability of the charge-compensated defect pair (2V{sub Cu}{sup {minus}}+In{sub Cu}{sup 2+}). {copyright} {ital 1997 American Institute of Physics.}

Research Organization:
National Renewable Energy Laboratory
DOE Contract Number:
AC36-83CH10093
OSTI ID:
552820
Report Number(s):
CONF-961178--
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 394; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English

Similar Records

Revisiting the defect physics in CuInSe{sub 2} and CuGaSe{sub 2}
Conference · Tue Dec 30 23:00:00 EST 1997 · OSTI ID:302495

Stabilization of Ternary Compounds via Ordered Arrays of Defect Pairs
Journal Article · Thu May 01 00:00:00 EDT 1997 · Physical Review Letters · OSTI ID:548770

Defect physics of the CuInSe{sub 2} chalcopyrite semiconductor
Journal Article · Tue Mar 31 23:00:00 EST 1998 · Physical Review, B: Condensed Matter · OSTI ID:600989