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Structure of vanadium oxide on supports as measure by the benzaldehyde-ammonia titration method

Journal Article · · J. Phys. Chem.; (United States)
DOI:https://doi.org/10.1021/j100301a020· OSTI ID:5527789
In order to clarify the structure of vanadium oxide on supports, the benzaldehyde-ammonia titration (BAT) method was applied to various supported vanadium oxide catalysts. Prior to the measurements, an infrared study of the adsorbed benzoate ion on TiO/sub 2/, ZrO/sub 2/, and CeO/sub 2/ was carried out to justify the BAT method to measure surface cus sites. The exposed surface area of the supports Al/sub 2/O/sub 3/, TiO/sub 2/, and ZrO/sub 2/ with different crystal phases was then measured, and the surface area of vanadium oxide supported was calculated by the difference between BET and exposed surfaced areas. On the other hand, the surface area of vanadium oxide on SiO/sub 2/ was measured after reduction on 773 K, because benzaldehyde was adsorbed on the reduced V/sub 2/O/sub 3/ but not on SiO/sub 2/. Based on these measurements, the relationship between percent coverage on support and surface V/sub 2/O/sub 5/ concentration was obtained. The structure of supported V/sub 2/O/sub 5/ thus determined depended on the kind of support, but not significantly on the crystal phase. Except in small concentration on Al/sub 2/O/sub 3/ and SiO/sub 2/, vanadium oxide formed a multilayer. The support surface at Al/sub 2/O/sub 3/(..gamma..) was covered most effectively, and the average thickness of V/sub 2/O/sub 5/ in 100% of the coverage was 3 layers. To the contrary, the SiO/sub 2/ surface was not covered effectively, and the average thickness attained up to 50 layers. Furthermore, ZrO/sub 2/ and TiO/sub 2/ showed intermediate behavior between these supports. It is shown that the coverage efficiency and thickness of the formed metal oxides are correlated with the electronegativity of the cations of supports.
Research Organization:
Nagoya Univ., Japan
OSTI ID:
5527789
Journal Information:
J. Phys. Chem.; (United States), Journal Name: J. Phys. Chem.; (United States) Vol. 91:17; ISSN JPCHA
Country of Publication:
United States
Language:
English