X-ray calibration: Techniques, sources, and detectors; Proceedings of the Meeting, San Diego, CA, Aug. 19, 20, 1986
Papers are presented on absolute intensity measurements in the vacuum UV; a Penning discharge source for EUV calibration; a laser produced plasma XUV radiation source; a variable pressure ion chamber for relative and absolute flux measurements; calibration of a 1-m diameter normal incidence EUV telescope/spectrometer; VUV spectrometer-detector system calibration using synchrotron radiation; and Wolter X-ray microscope calibration. Consideration is given to techniques of absolute low energy X-ray calibration; the evaluation of gratings for the Extreme UV Explorer (EUVE); soft X-ray calibration of diffracting materials; and the calibration of the thin film filters for the EUVE. Topics discussed include facilities and techniques for X-ray diagnostic calibration in the 100 eV to 100 KeV energy range; XUV radiometric standards at NBS; Los Alamos X-ray characterization facilities for plasma diagnostics; the calibration of solar EUV instrumentation in space; and direct X-ray response of charge-coupled devices and photodiode linear arrays.
- OSTI ID:
- 5522693
- Report Number(s):
- CONF-860880-
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
47 OTHER INSTRUMENTATION
ABSTRACTS
BREMSSTRAHLUNG
CALIBRATION
CHARGE-COUPLED DEVICES
CLOSED PLASMA DEVICES
COHERENT SCATTERING
DIFFRACTION
DOCUMENT TYPES
ELECTROMAGNETIC RADIATION
EQUIPMENT
FAR ULTRAVIOLET RADIATION
IONIZING RADIATIONS
LASER-PRODUCED PLASMA
LEADING ABSTRACT
MEASURING INSTRUMENTS
MEETINGS
MICROSCOPES
PLASMA
PLASMA DIAGNOSTICS
POINT SOURCES
PROPORTIONAL COUNTERS
RADIATION DETECTORS
RADIATION SOURCES
RADIATIONS
SCATTERING
SEMICONDUCTOR DEVICES
SPECTROMETERS
STANDARDS
SYNCHROTRON RADIATION
TELESCOPES
THERMONUCLEAR DEVICES
TOKAMAK DEVICES
ULTRAVIOLET RADIATION
USES
X RADIATION
X-RAY DIFFRACTION
X-RAY EQUIPMENT
X-RAY SOURCES