Measurements of absolute sensitivity of semiconductor detectors for 7--20 keV x rays using synchrotron radiation of VEPP-3 storage ring
- Institute of Nuclear Physics, 630090 Novosibirsk (USSR)
- Institute of Experimental Physics, 607200 Arzamas-16 (USSR)
Results of measurements of the absolute spectral sensitivity of silicon semiconductor detectors for 7--20 keV x rays are presented. Synchrotron radiation from a 2-T wiggler, installed at the VEPP-3 storage ring, was used for this study. Two quite different approaches were applied to measure the detector spectral sensitivity. According to the first approach, the measurements were performed in monochromatic radiation. The absolute photon flux was determined by a scintillation counter with known detection efficiency and monitored by a transmission ionization chamber. The second approach corresponds to the measurements in a white'' synchrotron radiation beam through sets of known absorption filters and via the following unfolding of the spectral sensitivity from a set of integral equations. The experimental results obtained by both procedures are in good agreement. The accuracy of the experimental calibration procedures is assumed to be not worse than 10%.
- OSTI ID:
- 5521195
- Journal Information:
- Review of Scientific Instruments; (United States), Vol. 63:1; ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SEMICONDUCTOR DETECTORS
SENSITIVITY
SYNCHROTRON RADIATION SOURCES
HARD X RADIATION
KEV RANGE 01-10
KEV RANGE 10-100
LASER-PRODUCED PLASMA
MONOCHROMATIC RADIATION
SILICON
STORAGE RINGS
X-RAY DETECTION
DETECTION
ELECTROMAGNETIC RADIATION
ELEMENTS
ENERGY RANGE
IONIZING RADIATIONS
KEV RANGE
MEASURING INSTRUMENTS
PLASMA
RADIATION DETECTION
RADIATION DETECTORS
RADIATION SOURCES
RADIATIONS
SEMIMETALS
X RADIATION
430303* - Particle Accelerators- Experimental Facilities & Equipment