Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Cleanliness and damage measurements of optics in atmospheric sensing high energy lasers

Conference ·
OSTI ID:552097
 [1];  [2];  [3]
  1. NASA Langley Research Center, Hampton, VA (United States)
  2. Hampton Univ., VA (United States)
  3. Cygnus Laser Corp., Duvall, WA (United States)

Langley Research Center has several atmospheric remote sensing programs which utilize, high energy pulsed lasers. These lasers typically have many damaged optics after several million shots. Damage is defined herein as color changes and/or optical flaws seen in microscopic inspection, and does not necessarily relate to measured performance degradation of the optic. Inspections and measurements of some of these optics indicate that energy thresholds for several million shots damage is about an order of magnitude lower than that for single shot damage. Damage initiation is often at micron size areas at the coating interface, which grows and sometimes develops as erosion of the top of the coating. There is a wide range in polish and coating quality of new optics, even on different faces of the same optic. Military Standard 1246C can be used to provide overall particulate, and molecular film, or nonvolatile residue (NTVR) cleanliness scales. Microscopic inspections and photography at I0x to 500x with brightfield (perpendicular) and darkfield (oblique) illumination are useful in assigning cleanliness levels of new and in-service optics. Microextraction (effecting concentration of molecular films to small areas) provides for enhanced optical detection and surface film chemical analysis by electron-microscope energy-dispersive-spectroscopy (EDS). Similar measurement techniques can be used to characterize and document optical damage initiation and optical damage growth. Surface contamination interferes with and complicates measurements of polish and coating quality, and of optical damage. This work indicates ultrasonic cleaning, and packaging of optics in Teflon sleeves or cups is advantageous over conventional cleaning and packaging for characterization of new optics.

Research Organization:
International Society for Optical Engineering, Washington, DC (United States)
OSTI ID:
552097
Report Number(s):
CONF-9510106--Vol.2714
Country of Publication:
United States
Language:
English

Similar Records

Optical cleanliness specifications and cleanliness verification
Conference · Thu Jul 01 00:00:00 EDT 1999 · OSTI ID:14657

The Particle Cleanliness Validation System
Conference · Thu Dec 20 23:00:00 EST 2001 · OSTI ID:802923

Advances in cleaning metal and glass surfaces to micron-level cleanliness
Journal Article · Tue Feb 28 23:00:00 EST 1978 · J. Vac. Sci. Technol.; (United States) · OSTI ID:5803129