A suite of programs for calculating x-ray absorption, reflection, and diffraction performance for a variety of materials at arbitrary wavelengths

Journal Article · Wed Jan 01 00:00:00 EST 1992 · Review of Scientific Instruments; (United States)

DOI:https://doi.org/10.1063/1.1142625· OSTI ID:5520432

Brennan, S ^[1]; Cowan, P L ^[2]

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1. Stanford Synchrotron Radiation Laboratory, Stanford, California 94309 (United States)
2. National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)

One of the most useful characteristics of synchrotron radiation is the wide spectral distribution of the source. For applications involving tuned monochromatic beams it is often helpful to predict the x-ray optical characteristics of a sample or the beam line optics at a particular wavelength. In contrast to this desire stands the fact that tabulated values for the optical parameters of interest are generally available only at wavelengths corresponding to typical x-ray tube sources. We have developed a suite of FORTRAN programs which calculate photoabsorption cross sections and atomic scattering factors for materials of arbitrary, uniform composition or for arbitrary layered materials. Further, the suite includes programs for calculation of x-ray diffraction or reflection from such materials. These programs are of use for experimental planning, data analysis, and predictions of performance of beam line optical elements.

• OSTI ID: 5520432
• Journal Information: Review of Scientific Instruments; (United States), Vol. 63:1; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
SYNCHROTRON RADIATION SOURCES
COMPUTER PROGRAM DOCUMENTATION
BEAM OPTICS
CROSS SECTIONS
FORTRAN
LIGHT SCATTERING
REFLECTIVITY
SPECTRAL FUNCTIONS
X-RAY DIFFRACTION
COHERENT SCATTERING
DIFFRACTION
FUNCTIONS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
PROGRAMMING LANGUAGES
RADIATION SOURCES
SCATTERING
SURFACE PROPERTIES
430400* - Particle Accelerators- Storage Rings