X-ray camera for high- and small-angle x-ray diffraction studies of the drawing and annealing of polymers at Daresbury Synchrotron Radiation Source

Journal Article · Wed Jan 01 00:00:00 EST 1992 · Review of Scientific Instruments; (United States)

DOI:https://doi.org/10.1063/1.1143104· OSTI ID:5520016

Mahendrasingam, A; Fuller, W; Forsyth, V T ^[1]; Oldman, R J ^[2]; MacKerron, D; Blundell, D J ^[3]

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1. Department of Physics, School of Physical Science and Engineering, Keele University, Staffordshire ST5 5BG (United Kingdom)
2. ICI Chemicals and Polymers, The Heath, Runcorn, Cheshire WA7 4QE (United Kingdom)
3. ICI Materials Research Centre, Wilton, Cleveland TS6 8JE (United Kingdom)

A purpose-designed x-ray fiber diffraction camera has been constructed in the Keele University Physics Department to be used at the SERC Daresbury Laboratory Synchrotron Radiation Source. The camera allows time-resolved studies of the change in both the high- and low-angle diffraction patterns during drawing and annealing of polymer films to be recorded. Drawing of the films is achieved by two opposed stepper motors which allow films to be drawn uniaxially in both directions. The temperature of the sample environment can be controlled to within 1 {degree}C by a radio spares proportional, integral, and derivative (PID) controller. Diffraction patterns can be recorded on the Enraf-Nonius TV FAST detector or on photographic film. Exposure times using the FAST detector are typically 5 s, representing a gain of approximately a factor of 5 over photographic film. The FAST detector has a further advantage over photographic film in that essentially an unlimited number of diffraction patterns can be recorded end-to-end while a structural transition is being followed. A video camera is incorporated to allow the variation in the gross appearance of the specimen to be recorded during drawing and annealing and to be related to the variation in the diffraction pattern. The application of the camera in the study of drawing and annealing of poly (aryl-ether-ether-ketone) (PEEK) is described.

• OSTI ID: 5520016
• Journal Information: Review of Scientific Instruments; (United States), Vol. 63:1; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
X-RAY EQUIPMENT
CAMERAS
ANNEALING
DESIGN
POLYMERS
SYNCHROTRON RADIATION SOURCES
X-RAY DIFFRACTION
COHERENT SCATTERING
DIFFRACTION
EQUIPMENT
HEAT TREATMENTS
RADIATION SOURCES
SCATTERING
440101* - Radiation Instrumentation- General Detectors or Monitors & Radiometric Instruments