Synchrotron x-ray diffraction analysis of photorefractive crystals and their gratings. Final report, 1 May 1990-30 April 1993

Technical Report · Mon Jul 26 00:00:00 EDT 1993

OSTI ID:5519702

Cronin-Golomb, M; Fogarty, G

High-resolution synchrotron x-ray diffraction imaging was used to examine the state of crystal perfection in the photorefractive ferroelectric materials barium titanate and strontium barium niobate. Ferroelectric 180 degree domains, dislocations, striations, faceted growth remnants, and other lattice features were identified. The technique was also used to image the photorefractive space charge field profile in-situ. Measurements of the field were compared with numerical simulations of the standard model of the photorefractive effect, and simulations of the x-ray image formation process. Photorefractive crystals, Synchrotron radiation, Diffraction imaging, X-Ray topography, Photorefractive gratings.

• Research Organization: Tufts Univ., Medford, MA (United States). Electro-Optics Technology Center
• OSTI ID: 5519702
• Report Number(s): AD-A-271176/0/XAB; CNN: DAAL03-90-G-0116
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CRYSTALS
X-RAY DIFFRACTION
FERROELECTRIC MATERIALS
CRYSTAL STRUCTURE
GRATINGS
CRYSTAL LATTICES
DISLOCATIONS
REFRACTION
SPACE CHARGE
STRIATIONS
SYNCHROTRON RADIATION
TOPOGRAPHY
BREMSSTRAHLUNG
COHERENT SCATTERING
CRYSTAL DEFECTS
DIFFRACTION
ELECTROMAGNETIC RADIATION
LINE DEFECTS
RADIATIONS
SCATTERING
360602* - Other Materials- Structure & Phase Studies