Picosecond time-resolved electron diffraction studies of laser heated metals

Conference · Mon Jan 01 04:00:00 EST 1990

OSTI ID:5514243

Elsayed-Ali, H E; Herman, J W; Lo, K K

Picosecond time-resolved high-energy electron diffraction is used as a lattice temperature probe of laser heated metal surfaces and thin films. A picosecond laser pulse is split into two beams. The first interacts with the sample. The second activates the cathode of an electron gun creating a collimated and focused electron pulse that is well synchronized with the heating laser pulse. The electron pulse is used to generate a reflection high-energy electron diffraction pattern of a surface or a transmission electron diffraction pattern of a thin film. Since heating results in an intensity reduction of the elastically scattered electrons (Debye-Waller effect), the diffraction patterns provide information on the lattice temperature as well as structure. Time-resolved surface temperature measurements show general agreement with that predicted by a heat diffusion model. 35 refs., 7 figs.

• Research Organization: Rochester Univ., NY (United States). Lab. for Laser Energetics
• Sponsoring Organization: DOE; ESEERC; NYSERDA; ONTHYD; ROCHESU; USDOE, Washington, DC (United States); Empire State Electric Energy Research Corp., New York, NY (United States); New York State Energy Research and Development Authority, Albany, NY (United States); Ontario Hydro, Toronto, ON (Canada); Rochester Univ., NY (United States)
• DOE Contract Number: FG02-88ER45376
• OSTI ID: 5514243
• Report Number(s): CONF-901263-10; ON: DE91016345
• Country of Publication: United States
• Language: English

Related Subjects

440500* -- Thermal Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
BEAM SPLITTING
COHERENT SCATTERING
DIFFRACTION
ELECTROMAGNETIC RADIATION
ELECTRON DIFFRACTION
FILMS
HEATING
LASER RADIATION
LASER-RADIATION HEATING
PLASMA HEATING
RADIATIONS
RESOLUTION
SCATTERING
SURFACE PROPERTIES
SURFACES
TEMPERATURE MEASUREMENT
THIN FILMS
TIME RESOLUTION
TIMING PROPERTIES