Cycle life test and failure model of nickel-hydrogen cells

Technical Report · Sat Jan 01 04:00:00 EST 1983

OSTI ID:5510260

Smithrick, J J

Six ampere hour individual pressure vessel nickel hydrogen cells were charge/discharge cycled to failure. Failure as used here is defined to occur when the end of discharge voltage is degraded to 0.9 volts. They were cycled under a low earth orbit cycle regime to a deep depth of discharge (80 percent of rated ampere hour capacity). Both cell designs were fabricated by the same manufacturer and represent current state of the art. A failure model was advanced which suggests both cell designs have inadequate volume tolerance characteristics. The limited existing data base at a deep depth of discharge (DOD) was expanded. Two cells of each design were cycled. One COMSAT cell failed at cycle 1712 and the other failed at cycle 1875. For the Air Force/Hughes cells, one cell failed at cycle 2250 and the other failed at cycle 2638. All cells, of both designs, failed due to low end of discharge voltage (0.9 volts). No cell failed due to electrical shorts. After cell failure, three different reconditioning tests (deep discharge, physical reorientation, and open circuit voltage stand) were conducted on all cells of each design. A fourth reconditioning test (electrolyte addition) was conducted on one cell of each design. In addition post cycle cell teardown and failure analysis were performed on the one cell of each design which did not have electrolyte added after failure.

• Research Organization: National Aeronautics and Space Administration, Cleveland, OH (USA). Lewis Research Center
• OSTI ID: 5510260
• Report Number(s): N-8325038; NASA-TM-83375; E-1643
• Country of Publication: United States
• Language: English

Related Subjects

25 ENERGY STORAGE
250902* -- Energy Storage-- Batteries-- Performance & Testing
DESIGN
ELECTRIC BATTERIES
ELECTROCHEMICAL CELLS
ENERGY STORAGE
FAILURE MODE ANALYSIS
METAL-GAS BATTERIES
NICKEL-HYDROGEN BATTERIES
PERFORMANCE TESTING
SERVICE LIFE
STORAGE
SYSTEM FAILURE ANALYSIS
SYSTEMS ANALYSIS
TECHNOLOGY ASSESSMENT
TESTING