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Universal critical scaling of dc and ac complex resistivities in an indium film near the vortex-glass transition

Journal Article · · Physical Review, B: Condensed Matter
;  [1]
  1. Research Center for Very Low Temperature System, Tokyo Institute of Technology, 2-12-1, Ohokayama, Meguro-ku, Tokyo 152 (Japan)
We have made ac complex resistivity measurements from 100 Hz to 5 MHz in the linear regime, as well as dc resistivity measurements, for a thick indium film in constant magnetic fields B. At B=0.1T, the vortex-glass transition temperature T{sub g} can be defined from the frequency-independent phase of the ac resistivity, which is in good accordance with the value determined independently from dc measurements. Critical exponents ({nu}{approximately}1.4, z{approximately}8) extracted from both dc and ac measurements are consistent. In addition to the vortex-correlation length {xi}{sub g}(T), the vortex-relaxation time {tau}{sub g}(T) is directly obtained from the frequency dependence of the ac resistivity. Within a limited critical regime ({vert_bar}T{minus}T{sub g}{vert_bar}{approximately}0.1K) about the phase transition, the amplitude and phase of the ac resistivity as well as the dc resistivity follow the universal scaling functions, which resemble those found in YBa{sub 2}Cu{sub 3}O{sub 7}. In B=1T, we have observed the similar scaling behavior for the dc resistivity to that in B=0.1T, whereas degradation of the scaled isotherms is visible for the ac resistivity. Although this problem still awaits further studies, all of these findings offer strong experimental evidence for the second-order transition in indium films. {copyright} {ital 1997} {ital The American Physical Society}
OSTI ID:
550524
Journal Information:
Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 21 Vol. 56; ISSN 0163-1829; ISSN PRBMDO
Country of Publication:
United States
Language:
English

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