Laser-induced desorption from sapphire surfaces

Conference · Sat Feb 29 23:00:00 EST 1992

OSTI ID:5504505

Hamza, A V; Schildbach, M A

Laser-induced desorption of energetic ({approximately}7eV) aluminum ions was observed from clean and water-covered sapphire (1102) surfaces using time-of-flight mass spectrometry with laser wavelengths of 1064, 355, and 266 nm. In sharp contrast, O{sup +} (H{sup +} and OH{sup +}) ions were observed in electron-induced desorption measurements with 300 eV electrons from the bare (water- covered) (1102) surface. Sapphire surfaces were characterized with low energy electron diffraction, reflection electron energy loss spectroscopy, and Auger electron spectroscopy. 8 refs.

• Research Organization: Lawrence Livermore National Lab., CA (United States)
• Sponsoring Organization: DOE; USDOE, Washington, DC (United States)
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 5504505
• Report Number(s): UCRL-JC-110159; CONF-920462--1; ON: DE92012698
• Country of Publication: United States
• Language: English

Related Subjects

440800 -- Miscellaneous Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
665300* -- Interactions Between Beams & Condensed Matter-- (1992-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABLATION
ALUMINIUM COMPOUNDS
ALUMINIUM IONS
ALUMINIUM OXIDES
CHALCOGENIDES
CHARGED PARTICLES
COHERENT SCATTERING
CORUNDUM
DESORPTION
DIFFRACTION
DYNAMIC MASS SPECTROMETERS
ELECTROMAGNETIC RADIATION
ELECTRON DIFFRACTION
ELECTRON SPECTROSCOPY
ENERGY-LOSS SPECTROSCOPY
HYDROGEN COMPOUNDS
HYDROGEN IONS
HYDROXIDES
IONS
LASER RADIATION
MASS SPECTROMETERS
MEASURING INSTRUMENTS
MINERALS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
OXYGEN IONS
RADIATIONS
SAPPHIRE
SCATTERING
SPECTROMETERS
SPECTROSCOPY
TIME-OF-FLIGHT MASS SPECTROMETERS
TIME-OF-FLIGHT SPECTROMETERS