Influence of structure on the electrical conductivity of polycrystalline PbTe films
Journal Article
·
· Inorg. Mater. (Engl. Transl.); (United States)
OSTI ID:5498818
This paper attempts to clarify the general systematics of the influence of structure on the electrical conductivity of polycrystalline PbTe films. Polycrystalline PbTe layers were prepared by cathodic sputtering in a d.c. field in argon atmosphere by deposition of the sputtered material on unheated to liquid-nitrogen cooled glassy substrate. Results of the experiments show that the resistivity of freshly prepared polycrystalline PbTe films on glassy substrates is related to the average grain size D, and that the structure of the films is unstable. The thermal width of the band gap of polycrystalline films does not depend on the average grain size in a wide region of their variation.
- Research Organization:
- Donets Physicochemical Institute, Academy of Sciences of the Ukrainian SSR
- OSTI ID:
- 5498818
- Journal Information:
- Inorg. Mater. (Engl. Transl.); (United States), Journal Name: Inorg. Mater. (Engl. Transl.); (United States) Vol. 21:7; ISSN INOMA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360602 -- Other Materials-- Structure & Phase Studies
360603* -- Materials-- Properties
AGING
ANNEALING
CATHODE SPUTTERING
CHALCOGENIDES
COATINGS
COHERENT SCATTERING
CRYSTAL STRUCTURE
CRYSTALS
DIFFRACTION
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
FILMS
GLASS
GRAIN SIZE
HEAT TREATMENTS
LEAD COMPOUNDS
LEAD TELLURIDES
MICROSTRUCTURE
PHYSICAL PROPERTIES
POLYCRYSTALS
SCATTERING
SIZE
SPUTTERING
SUBSTRATES
TELLURIDES
TELLURIUM COMPOUNDS
TEMPERATURE EFFECTS
THIN FILMS
VAPOR DEPOSITED COATINGS
X-RAY DIFFRACTION
360602 -- Other Materials-- Structure & Phase Studies
360603* -- Materials-- Properties
AGING
ANNEALING
CATHODE SPUTTERING
CHALCOGENIDES
COATINGS
COHERENT SCATTERING
CRYSTAL STRUCTURE
CRYSTALS
DIFFRACTION
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
FILMS
GLASS
GRAIN SIZE
HEAT TREATMENTS
LEAD COMPOUNDS
LEAD TELLURIDES
MICROSTRUCTURE
PHYSICAL PROPERTIES
POLYCRYSTALS
SCATTERING
SIZE
SPUTTERING
SUBSTRATES
TELLURIDES
TELLURIUM COMPOUNDS
TEMPERATURE EFFECTS
THIN FILMS
VAPOR DEPOSITED COATINGS
X-RAY DIFFRACTION