Ultrashort optical waveform measurements using frequency-resolved optical gating

Journal Article · Sat Apr 01 04:00:00 EST 1995 · Optics Letters

DOI:https://doi.org/10.1364/OL.20.000743· OSTI ID:54916

Taft, G; Rundquist, A; Murnane, M M; Kapteyn, H C ^[1]; DeLong, K W; Trebino, R ^[2]; Christov, I P ^[3]

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1. Department of Physics, Washington State University, Pullman, Washington 99164-2814 (United States)
2. Combustion Research Facility, Sandia National Laboratories, Livermore, California 94551 (United States)
3. Faculty of Physics, Sofia University, Sofia (Bulgaria)

We measure the intensity and phase of ultrashort pulses from a self-mode-locked Ti:sapphire laser using the recently developed technique of frequency-resolved optical gating. These results represent to our knowledge the shortest complete optical waveform characterization measurements performed to date. We also verify recent theoretical calculations that predict that the main limitation on the pulse duration from these lasers is the presence of uncompensated higher-order dispersion.

• Sponsoring Organization: USDOE
• OSTI ID: 54916
• Journal Information: Optics Letters, Journal Name: Optics Letters Journal Issue: 7 Vol. 20; ISSN 0146-9592; ISSN OPLEDP
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
HARMONIC GENERATION
MODE LOCKING
PULSE TECHNIQUES
SOLID STATE LASERS