Thickness measurement of gold contact layers in Si(Li) and Ge x-ray detectors

Journal Article · Fri Feb 01 04:00:00 EST 1980 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.327707· OSTI ID:5489445

Shima, K; Umetani, K; Mikumo, T

Four kinds of Si(Li) and a high-purity Ge x-ray detectors have been tested to measure the thicknesses of gold contact layers by comparing the response of the primary Rb-K..cap alpha.. x-rays with that of the induced Au-L..cap alpha.. x rays. Observed thicknesses ranged from 140 to 260 A. Near the x-ray energies of Au-M subshell absorption edges, the contribution of x-ray transmission through the observed gold layers to the detection efficiency is greater than or equivalent to that of the inherently attached 7.6-..mu..m beryllium window. Hence, one must be careful in the determination of the detection efficiency in x-ray semiconductor detector when low-energy x rays of less than about 4 keV are measured.

• Research Organization: Tandem Accelerator Center, University of Tsukuba, Ibaraki 300-31 Japan
• OSTI ID: 5489445
• Journal Information: J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 51:2; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALKALI METALS
COMPARATIVE EVALUATIONS
DATA
DETECTION
DIMENSIONS
ELECTRIC CONTACTS
ELECTRICAL EQUIPMENT
ELECTROMAGNETIC RADIATION
ELEMENTS
EQUIPMENT
GERMANIUM
GOLD
INFORMATION
IONIZING RADIATIONS
LAYERS
LITHIUM
MEASURING INSTRUMENTS
METALS
RADIATION DETECTION
RADIATION DETECTORS
RADIATIONS
RUBIDIUM
SEMICONDUCTOR DETECTORS
SEMIMETALS
SILICON
THICKNESS
TRANSITION ELEMENTS
X RADIATION
X-RAY DETECTION