Glass-derived superconducting ceramics with zero resistance at 107 K in the Bi sub 1. 5 Pb sub 0. 5 Sr sub 2 Ca sub 2 Cu sub 3 O sub x system
- National Aeronautics and Space Administration, Lewis Research Center, Cleveland, Ohio 44135 (US)
A melt of composition Bi{sub 1.5}Pb{sub 0.5}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub {ital x}} was fast quenched to form a glass. This was subsequently air annealed and the influence of annealing time and temperature on the formation of various crystalline phases was investigated. X-ray powder diffraction indicated that none of the resulting samples were single phase. However, for an annealing temperature of 840 {degree}C, the volume fraction of the high {ital T}{sub {ital c}} phase (isostructural with Bi{sub 2}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub 10}) increased with annealing time. A specimen annealed at this temperature for 243 h followed by slow cooling showed a sharp transition ({Delta}{ital T}{sub {ital c}} (10--90%) {similar to}2 K) and {ital T}{sub {ital c}} ({ital R}=0)=107.2 K. To our knowledge, this is the highest {ital T}{sub {ital c}} yet reported for any superconductor prepared via the glass route.
- OSTI ID:
- 5486224
- Journal Information:
- Applied Physics Letters; (USA), Journal Name: Applied Physics Letters; (USA) Vol. 55:15; ISSN APPLA; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALKALINE EARTH METAL COMPOUNDS
ANNEALING
BISMUTH COMPOUNDS
BISMUTH OXIDES
CALCIUM COMPOUNDS
CALCIUM OXIDES
CERAMICS
CHALCOGENIDES
CHEMICAL COMPOSITION
COHERENT SCATTERING
COPPER COMPOUNDS
COPPER OXIDES
DATA
DIFFRACTION
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
EXPERIMENTAL DATA
GLASS
HEAT TREATMENTS
INFORMATION
LEAD COMPOUNDS
LEAD OXIDES
MELTING
NUMERICAL DATA
OXIDES
OXYGEN COMPOUNDS
PEROVSKITES
PHASE TRANSFORMATIONS
PHYSICAL PROPERTIES
QUENCHING
SCATTERING
STRONTIUM COMPOUNDS
STRONTIUM OXIDES
SUPERCONDUCTIVITY
THERMODYNAMIC PROPERTIES
TRANSITION ELEMENT COMPOUNDS
TRANSITION TEMPERATURE
VERY HIGH TEMPERATURE
X-RAY DIFFRACTION