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Mid-infrared reflectivity and ellipsometry measurements on single-crystal YBa sub 2 Cu sub 3 O sub 7 and Bi sub 2 Sr sub 2 CuO sub 6+ y

Journal Article · · Physical Review (Section) B: Condensed Matter; (USA)
 [1];  [2];  [3];  [4];  [2]
  1. Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544 (US)
  2. Department of Physics, Princeton University, Princeton, New Jersey 08544
  3. Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544
  4. Department of Electrical Engineering and Department of Physics, Princeton University, Princeton, New Jersey 08544
We have measured the room-temperature reflectivity of 90-K'' single crystals YBa{sub 2}Cu{sub 3}O{sub 7} in the frequency range 600--9000 cm{sup {minus}1}. The reflectivity {ital R} in these highly conducting samples ({rho}{sub {ital ab}}=150 {mu}{Omega} cm at 290 K) is found to be higher than in previous reports. We fit {ital R} to a simple Drude-Lorentz model and compare the fit parameters with the dc transport values. (The effective-mass ratio of the carriers is found to be 2.0, and the scattering rate {h bar}/{tau} is 3.1{ital k}{sub {ital B}}T at room temperature.) Ellipsometry measurements have also been performed using transverse-electric and transverse-magnetic polarizations. The dielectric dispersion derived from ellipsometry shows some important deviations from the Drude-Lorentz model. Reflectivity data from nonsuperconducting crystals of Bi{sub 2}Sr{sub 2}CuO{sub 6+{ital y}} are also reported.
OSTI ID:
5485933
Journal Information:
Physical Review (Section) B: Condensed Matter; (USA), Journal Name: Physical Review (Section) B: Condensed Matter; (USA) Vol. 40:10; ISSN 0163-1829; ISSN PRBMD
Country of Publication:
United States
Language:
English