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Oxygen diffusion in La/sub 2-//sub x/Sr/sub x/CuO/sub 4-//sub y/

Journal Article · · J. Mat. Res.; (United States)
OSTI ID:5485002
Diffusion of /sup 18/O in the superconductor La/sub 2-//sub x/Sr/sub x/CuO/sub 4-//sub y/ has been measured as a function of x (0 to 0.20) between 300 and 500 /sup 0/C at an oxygen partial pressure of approx. =1 atm. Concentration profiles were obtained using a secondary ion mass spectrometer. The diffusion coefficient decreases with increasing Sr additions from 0.1 to 0.2, primarily because of an increase in activation energy. This result, which is contradictory to the expectation that the diffusion coefficient should increase with increasing vacancy concentration caused by the added Sr, can be explained if oxygen vacancies are bound to Sr clusters. Measurements on samples with x = 0 or 0.05 were unsuccessful, probably because of porosity.
Research Organization:
Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
5485002
Journal Information:
J. Mat. Res.; (United States), Journal Name: J. Mat. Res.; (United States) Vol. 3:1; ISSN JMREE
Country of Publication:
United States
Language:
English