Supercurrent distribution and flux penetration in high-{Tc} edge Josephson junctions
Book
·
OSTI ID:548492
- Univ. of Virginia, Charlottesville, VA (United States). Dept. of Physics
- Conductus, Inc., Sunnyvale, CA (United States)
The spatial distribution of supercurrent in high-{Tc} Josephson junction devices has been studied extensively using field modulation measurements of the critical current and microwave absorption. The devices are edge junctions composed of YBa{sub 2}Cu{sub 3}O{sub 7}-YBa{sub 2}Co{sub 0.21}Cu{sub 2.79}O{sub 7}-YBa{sub 2}Cu{sub 3}O{sub 7}. The I{sub c}(H) patterns allow a quantitative Fourier transform analysis to obtain a self-consistent spatial supercurrent density distribution, J{sub s}(x). These junctions are found to be more homogeneous than in most other high-{Tc} Josephson junctions reported to date.
- OSTI ID:
- 548492
- Report Number(s):
- CONF-960163--; ISBN 0-8194-2071-9
- Country of Publication:
- United States
- Language:
- English
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