Annealing effects in solid-state track recorders
Current analyses of the annealing process in Solid State Track Recorders (SSTR) reveal fundamental misconceptions. The use of the Arrhenius equation to describe the decrease in track density resulting from annealing is shown to be incorrect. To overcome these deficiencies, generalized reaction rate theory is used to describe the annealing process in SSTR. Results of annealing experiments are used to guide this theoretical formulation. Within this framework, the concept of energy per etchable defect for SSTR is introduced. A general correlation between sensitivity and annealing susceptibility in SSTR is deduced. In terms of this general theory, the apparent correlation between fission track size and fission track density observed under annealing is readily explained. Based on this theoretical treatment of annealing phenomena, qualitative explanations are advanced for current enigmas in SSTR cosmic ray work.
- Research Organization:
- Hanford Engineering Development Lab., Richland, WA (USA)
- DOE Contract Number:
- AC06-76FF02170
- OSTI ID:
- 5481102
- Report Number(s):
- HEDL-SA-2382-FP; CONF-8109100-5; ON: DE82005192
- Country of Publication:
- United States
- Language:
- English
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