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An ion-beam analysis facility

Conference · · IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:5481066

Accelerator-beam analysis methods have received increasing attention and acceptance in recent years. Proton induced X-ray emission (PIXE) analysis has seen extensive development. For the past seven years approximately 10% of the time of the Florida State University Super FN Tandem Van de Graaff has been used with major emphases upon proton elastic scattering analysis (PESA) and PIXE applied to environmental air particulate problems. Plans for the immediate future include completion of a 4MV Van de Graaff laboratory dedicated primarily to quantity output of PIXE analyses while freeing the limited time on the larger Tandem accelerator for PESA and development of new methods. With the addition of such a dedicated accelerator the need for further dedicated computing facilities is evident. With a conservative estimate of operation at 300,000 samples per year, on-line data evaluation is not only desirable but almost essential. A sophisticated, non-linear, least squares computer code developed at our laboratory for PIXE spectrum evaluation has the capability of simultaneously analyzing up to 200 peaks while accounting for interference and absorption in times of 20 seconds to 1 minute. This rapid data evaluation opens the possibility of immediate further processing into even more desired forms than arrays of numbers representing quantitative analyses. Examples of results from varied applications are presented and the usefulness of such a facility is discussed.

Research Organization:
Florida State University, Tallahassee, FL
OSTI ID:
5481066
Report Number(s):
CONF-801111-
Journal Information:
IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. NS-28:2; ISSN IETNA
Country of Publication:
United States
Language:
English