Annular X-ray inspection system
This patent describes a high resolution imaging device where resolution is not degraded by high energy illumination. The device comprises: a source of high energy illuminating radiation directed at an object to be imaged; means for supporting the object and for advancing the object in a first direction relative to the source of high energy illuminating radiation; detector means for developing electrical signals representative illuminating radiation, the detector means comprising plural scintillating optical fibers; an opto-electronic transducer arranged to image one end of the scintillating optical fibers, wherein the scintillating optical fibers are arranged in groups and the opto-electric transducer has a plurality of opto-electric transducer elements, each opto-electric transducer element arranged to image one end of different groups of the scintillating optical fibers; means for storing a representation of an electrical signal, output from the opto-electrical transducer elements; and data analysis means responsive to stored signal representations for producing a visual representation of anomalies in the object in a matrix format plotting angular orientation versus radial position.
- Assignee:
- American Science and Engineering, Inc., Cambridge, MA
- Patent Number(s):
- US 4845769
- Application Number:
- PPN: US 6819655A
- OSTI ID:
- 5475673
- Country of Publication:
- United States
- Language:
- English
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