Determination and automatic control of optical thickness of scanning Fabry-Perot interferometer
Journal Article
·
· Instrum. Exp. Tech. (Engl. Transl.); (United States)
OSTI ID:5465907
This paper presents a method and a device for determination and control of the optical thickness of a scanning Fabry-Perot interferometer (FPI) of 973 to 29,800 um with a relative error of o.04%. The device scans the optical thickness of the interferometer itself and records the shift of the interference peaks when the interferometer is exposed to radiation containing two wavelengths. The interferometer is exposed to the collimated radiation of a VSB-2 spectroscopic lamp filled with mercury isotopes Hg 198 and Hg 204. A ZS-1 glass filter separates the two wavelengths and the transmitted light at the output of the FPI has an interference pattern formed by two independent systems of rings. It is noted that the disadvantage of the described device is the complexity of preparing interferometer-plate reflecting layers that have high reflection coefficients for the two working wavelengths simultaneously.
- Research Organization:
- State Union Sci-Res. Analytic Chemistry Institute, Leningrad
- OSTI ID:
- 5465907
- Journal Information:
- Instrum. Exp. Tech. (Engl. Transl.); (United States), Journal Name: Instrum. Exp. Tech. (Engl. Transl.); (United States) Vol. 28:6, PT. 2; ISSN INETA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
BEAM MONITORS
BEAM OPTICS
BEAM SCANNERS
BEAM SPLITTING
CALIBRATION
COMPUTERIZED CONTROL SYSTEMS
CONTROL SYSTEMS
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
EQUIPMENT
EVEN-EVEN NUCLEI
FABRY-PEROT INTERFEROMETER
FILTERS
HEAVY NUCLEI
INTERFEROMETERS
ISOTOPES
MEASURING INSTRUMENTS
MERCURY 198
MERCURY 204
MERCURY ISOTOPES
MONITORS
NUCLEI
OPACITY
OPTICAL FILTERS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
PULSE CONVERTERS
SPECTROSCOPY
STABLE ISOTOPES
TIMING CIRCUITS
WAVELENGTHS
47 OTHER INSTRUMENTATION
BEAM MONITORS
BEAM OPTICS
BEAM SCANNERS
BEAM SPLITTING
CALIBRATION
COMPUTERIZED CONTROL SYSTEMS
CONTROL SYSTEMS
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
EQUIPMENT
EVEN-EVEN NUCLEI
FABRY-PEROT INTERFEROMETER
FILTERS
HEAVY NUCLEI
INTERFEROMETERS
ISOTOPES
MEASURING INSTRUMENTS
MERCURY 198
MERCURY 204
MERCURY ISOTOPES
MONITORS
NUCLEI
OPACITY
OPTICAL FILTERS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
PULSE CONVERTERS
SPECTROSCOPY
STABLE ISOTOPES
TIMING CIRCUITS
WAVELENGTHS