Secondary electrons induced by fast ions under channeling conditions. II. Screening of fast heavy ions in solids

Journal Article · Sat Jun 01 00:00:00 EDT 1991 · Physical Review, B: Condensed Matter; (USA)

DOI:https://doi.org/10.1103/PhysRevB.43.12736· OSTI ID:5461855

Kudo, H; Shima, K ^[1]; Seki, S; Ishihara, T ^[2]

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1. Institute of Applied Physics, University of Tsukuba, Ibaraki 305 (Japan)
2. Tandem Accelerator Center, University of Tsukuba, Ibaraki 305 (Japan)

Ion-beam shadowing effects have been observed for secondary electrons induced by various ions in the energy range of 1.8--3.8 MeV/amu, under various channeling conditions in Si and GaAs crystals. From a comparison of the energy spectra of electrons induced by ions of equal velocity, we have found reduced shadowing effects for heavy ions (Si, S, and Cl) as compared with light (H, He, C, and O) ions. It is concluded that the reduction results from the screening of the heavy ion's nuclear charge by bound electrons. By analyzing the reduced shadowing effect, the effective nuclear charges for the heavy ions within the target crystals have been determined.

• OSTI ID: 5461855
• Journal Information: Physical Review, B: Condensed Matter; (USA), Vol. 43:16; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
GALLIUM ARSENIDES
ION CHANNELING
SILICON
CHLORINE IONS
ELECTRON EMISSION
ION BEAMS
SCREENING
SILICON IONS
SULFUR IONS
ARSENIC COMPOUNDS
ARSENIDES
BEAMS
CHANNELING
CHARGED PARTICLES
ELEMENTS
EMISSION
GALLIUM COMPOUNDS
IONS
PNICTIDES
SEMIMETALS
656003* - Condensed Matter Physics- Interactions between Beams & Condensed Matter- (1987-)