In-situ X-ray diffraction study of diffusion-controlled coarsening kinetics in an Ni-Si alloy. [Ni-12. 5 at% Si]
Conference
·
· TMS (The Metallurgical Society) Paper Selection; (USA)
OSTI ID:5451447
- Univ. of Illinois, Urbana (USA)
In-situ high temperature x-ray diffraction experiments have been performed on bulk Ni-12.5at%Si alloy single crystals in order to study the growth behavior of {gamma}{prime} precipitates from a disordered, supersaturated solid solution, and to test the Lifshitz-Slyozov-Wagner (LSW) theory of diffusion-controlled coarsening kinetics. The integrated intensity and the line width of superlattice reflections representative of the {gamma}{prime} phase were continuously monitored with time at 400 C, 450 C, 500 C and 550 C. Results show that the precipitate is generally spherical in shape and particle size follows the t{sup 1/3} growth behavior. Furthermore, the growth in volume fraction obeys an exponential relationship. All of the above observations are consistent with the LSW model. Subsequent analysis based upon this model yielded interdiffusion coefficient which is in good agreement with other data obtained at higher temperatures using different techniques.
- OSTI ID:
- 5451447
- Report Number(s):
- CONF-840909--
- Conference Information:
- Journal Name: TMS (The Metallurgical Society) Paper Selection; (USA) Journal Volume: 56
- Country of Publication:
- United States
- Language:
- English
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Journal Article
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·
OSTI ID:6960569
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Related Subjects
36 MATERIALS SCIENCE
360102* -- Metals & Alloys-- Structure & Phase Studies
ALLOYS
COHERENT SCATTERING
CRYSTAL STRUCTURE
DIFFRACTION
DIFFUSION
KINETICS
MATHEMATICAL MODELS
MICROSTRUCTURE
NICKEL ALLOYS
NICKEL BASE ALLOYS
PARTICLE SIZE
PRECIPITATION
SCATTERING
SEPARATION PROCESSES
SHAPE
SILICON ALLOYS
SIZE
TEMPERATURE DEPENDENCE
X-RAY DIFFRACTION
360102* -- Metals & Alloys-- Structure & Phase Studies
ALLOYS
COHERENT SCATTERING
CRYSTAL STRUCTURE
DIFFRACTION
DIFFUSION
KINETICS
MATHEMATICAL MODELS
MICROSTRUCTURE
NICKEL ALLOYS
NICKEL BASE ALLOYS
PARTICLE SIZE
PRECIPITATION
SCATTERING
SEPARATION PROCESSES
SHAPE
SILICON ALLOYS
SIZE
TEMPERATURE DEPENDENCE
X-RAY DIFFRACTION