{bold {ital In situ}} measurements of texture and phase development in (Bi,Pb){sub 2}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub 10}{endash}Ag tapes

Journal Article · Tue Apr 01 04:00:00 EST 1997 · Journal of Materials Research

DOI:https://doi.org/10.1557/JMR.1997.0129· OSTI ID:544546

Thurston, T R ^[1]; Haldar, P ^[2]; Wang, Y L; Suenaga, M ^[3]; Jisrawi, N M ^[1]; Wildgruber, U ^[1]

---

1. Department of Physics, Brookhaven National Laboratory, Upton, New York 11973 (United States)
2. Intermagnetics General Corporation, Latham, New York 12110 (United States)
3. Department of Applied Science, Brookhaven National Laboratory, Upton, New York 11973 (United States)

Hard x-rays from a synchrotron source were utilized in diffraction experiments performed at elevated temperatures (up to {approximately}870{degree}C) on (Bi,Pb){sub 2}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub 10} (Bi-2223) tapes {ital completely} encased in silver. The general behavior of the phase and texture development under typical processing conditions was determined, and the effects that several variations in processing conditions had on the phase and texture development were examined. These results and their implications for improving processing conditions are discussed. {copyright} {ital 1997 Materials Research Society.}

• Research Organization: Brookhaven National Laboratory
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 544546
• Journal Information: Journal of Materials Research, Journal Name: Journal of Materials Research Journal Issue: 4 Vol. 12; ISSN JMREEE; ISSN 0884-2914
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BISMUTH OXIDES
CALCIUM OXIDES
COPPER OXIDES
HIGH-TC SUPERCONDUCTORS
LEAD OXIDES
MICROSTRUCTURE
PHASE STUDIES
SILVER
STRONTIUM OXIDES
TEXTURE
X-RAY DIFFRACTION
superconducting tapes