Dependence of tracer diffusion on atomic size in amorphous Ni-Zr

Journal Article · Fri Apr 15 04:00:00 EDT 1988 · Phys. Rev. B: Condens. Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.37.6533· OSTI ID:5444240

Hahn, H; Averback, R S

Tracer diffusion coefficients for several impurities and Ni self-atoms were measured in amorphous (a-) Ni/sub 50/Zr/sub 50/ at 573 K using secondary-ion-mass spectroscopy, Rutherford backscattering, and radioactive tracer methods. The results showed that atomic mobility in the a-Ni-Zr alloy depends strongly on atomic size, decreasing rapidly with increasing atomic radius. This diffusion behavior is similar to that in ..cap alpha..-Zr and ..cap alpha..-Ti and is suggestive of an interstitial-like mechanism of diffusion. The consequences of these results for solid-state amorphization transformations are discussed.

• Research Organization: Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
• OSTI ID: 5444240
• Journal Information: Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 37:11; ISSN PRBMD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360104* -- Metals & Alloys-- Physical Properties
ALLOYS
AMORPHOUS STATE
ATOMS
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
DIFFUSION
FILMS
HIGH TEMPERATURE
IMPURITIES
INTERSTITIALS
ISOTOPE APPLICATIONS
NICKEL ALLOYS
POINT DEFECTS
RADIOACTIVE TRACER LOGGING
RADIOACTIVITY LOGGING
SELF-DIFFUSION
THIN FILMS
TRACER TECHNIQUES
WELL LOGGING
ZIRCONIUM ALLOYS