Astrophysical extended X-ray absorption fine-structure analysis
- Harvard-Smithsonian Center for Astrophysics, 60 Garden Street, Cambridge, Massachusetts 02138 (United States)
- Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States)
We present an astrophysical extended X-ray absorption fine-structure (EXAFS) analysis (AEA) tool. The AEA tool is designed to generate a numerical model of the modification to the X-ray absorption coefficient due to the EXAFS phenomenon. We have constructed a complete database (elements up to the atomic number 92) of EXAFS parameters: central atom phase shift (2{delta}{sub 1}), backscattering phase shift ({phi}{sub b}), and backscattering amplitude (F). Using the EXAFS parameter data base, the AEA tool can generate a numerical model of any compound when the atomic numbers of neighboring atoms and their distances to the central X-ray-absorbing atom are given. {copyright} {ital 1997} {ital The American Astronomical Society}
- OSTI ID:
- 543759
- Journal Information:
- Astrophysical Journal, Journal Name: Astrophysical Journal Journal Issue: 1 Vol. 477; ISSN ASJOAB; ISSN 0004-637X
- Country of Publication:
- United States
- Language:
- English
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