X-ray photoelectron spectroscopic study of the oxide film on an aluminum-tin alloy in 3.5% sodium chloride solution

Journal Article · Wed Oct 01 00:00:00 EDT 1997 · Corrosion

DOI:https://doi.org/10.5006/1.3290265· OSTI ID:543530

Venugopal, A; Selvam, P; Raja, V S ^[1]; Veluchamy, P; Minoura, H ^[2]

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1. Indian Inst. of Tech., Powai, Mumbai (India)
2. Gifu Univ. (Japan). Dept. of Applied Chemistry

Oxide films on Al and an Al-Sn alloy were analyzed by x-ray photoelectron spectroscopy (XPS) after immersion in 3.5% sodium chloride (NaCl) solution. Results showed Sn exhibited both Sn{sup 2+} and Sn{sup 4+} oxidation stats in the oxide film. It was proposed that incorporation of these cations in the film would result in generation of more anionic and cationic vacancies in aluminum oxide (Al{sub 2}O{sub 3}), leading to active dissolution of Al.

• Sponsoring Organization: USDOE
• OSTI ID: 543530
• Journal Information: Corrosion, Journal Name: Corrosion Journal Issue: 10 Vol. 53; ISSN 0010-9312; ISSN CORRAK
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALUMINIUM
ALUMINIUM ALLOYS
CATHODIC PROTECTION
CHEMICAL ACTIVATION
DISSOLUTION
FILMS
OXIDATION
PHOTOELECTRON SPECTROSCOPY
SODIUM CHLORIDES
TIN ALLOYS
VACANCIES