Thermal shift in the binding energy of bulk W 4f{sub 7/2}

Journal Article · Mon Sep 01 04:00:00 EDT 1997 · Physical Review, B: Condensed Matter

DOI:https://doi.org/10.1103/PhysRevB.56.6982· OSTI ID:542631

Tao, H; Madey, T E ^[1]; Rowe, J E; Wertheim, G K ^[2]

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1. Department of Physics and Astronomy and Laboratory for Surface Modification, Rutgers, The State University of New Jersey, Piscataway, New Jersey 08855-0849 (United States)
2. Bell Laboratories, Lucent Technologies, Murray Hill, New Jersey 07974-2070 (United States)

High-resolution photoelectron spectroscopy using synchrotron radiation is used to measure the binding energy of the W 4f{sub 7/2} core level associated with bulk atoms of a W(111) crystal in the temperature range from 80 to 780 K. As temperature increases the lattice expands and the binding energy of bulk W 4f{sub 7/2} decreases. A total shift of {minus}45 meV is measured at 780 K with respect to the binding energy of bulk W 4f{sub 7/2} at 80 K. The mechanism responsible for this shift can be understood quantitatively in terms of a Friedel model, in which the narrowing of the d band as well as the shift of the center of the d band relative to the bottom of the conduction band due to the lattice expansion play dominant roles in shifting the binding energy toward lower energies. {copyright} {ital 1997} {ital The American Physical Society}

• Research Organization: Brookhaven National Laboratory
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 542631
• Journal Information: Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 11 Vol. 56; ISSN PRBMDO; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BINDING ENERGY
ELECTRONIC STRUCTURE
NSLS
PHOTOEMISSION
SPECTRAL SHIFT
SYNCHROTRON RADIATION
TEMPERATURE DEPENDENCE
THERMAL EXPANSION
TUNGSTEN