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Detection of gaseous organophosphorus compounds using secondary ion mass spectrometry

Journal Article · · Anal. Chem.; (United States)
DOI:https://doi.org/10.1021/ac00281a024· OSTI ID:5424109
Molecular secondary ion mass spectrometry (SIMS) has been investigated for sensitivity and selectivity in the analysis of gaseous organophosphorus compounds. Abundant analyte ions were observed when the gaseous organophosphorus compounds were admitted into the secondary ion source, where a matrix was under primary ion bombardment. The best matrix for the detection of dimethyl methylphosphonate (DMMP), trimethyl phosphate (TMP), and diisopropyl methylphosphonate (DIMP) was determined to be polyphosphoric acid. The abundance of secondary analyte ions was observed to be linear with the introduction rate of gaseous analyte. The introduction rate necessary to produce a 3:1 signal-to-noise ratio in the intensity of secondary protonated molecular ions from DMMP was estimated to be 4 x 10/sup -11/ mols/sup -1/. Substantially more analyte fragmentation is observed by using SIMS than by using methane chemical ionization mass spectrometry. Ten compounds representative of other compound classes were investigated in the same manner as the organic phosphonates; characteristic secondary protonated molecular ions were detected from amines only.
Research Organization:
Oak Ridge National Lab., TN
DOE Contract Number:
AC05-84OR21400
OSTI ID:
5424109
Journal Information:
Anal. Chem.; (United States), Journal Name: Anal. Chem.; (United States) Vol. 57:4; ISSN ANCHA
Country of Publication:
United States
Language:
English