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Title: Dielectric properties and the monoclinictriclinic inversion in albite

Conference · · EOS, Trans., Am. Geophys. Union; (United States)
OSTI ID:5414393

Dielectric properties (epsilon', real part of complex permittivity; epsilon'', imaginary part of complex permittivity; tan delta, loss tangent = epsilon''/epsilon') of single crystal Amelia albite have been measured parallel to the b-axis under controlled oxygen fugacity near the QFM buffer in the temperature range 1000 to 1373/sup 0/K at frequencies (..nu..) of 0.2 to 10 kHz. Plots of epsilon' and epsilon'' as a function of temperature exhibit minima which depend on time and ..nu.. in this albite. In addition, plots of tan delta as a function of temperature develop maxima which are also time-dependent. When epsilon', epsilon'', and tan delta were investigated between 1220 and 1320/sup 0/K as a function of time, a break in these dielectric parameters with temperature was found. Epsilon' and epsilon'' increased with time above this break, while they decreased with time below the break. Values of loss tangent were also non-linear functions of temperature. Epsilon' and epsilon'' minima, tan delta maxima, and the temperature break in these dielectric properties were found to converge at approximately 1283/sup 0/K as time increases. Assuming that the epsilon' and epsilon'' increase and the tan delta decrease are the result of increasing disorder in this albite, these experimental data suggest that 1283 +- 20/sup 0/K is the temperature of the monoclinic-triclinic transition in this albite. This agrees well with electrical conductivity results which indicate 1253 +- 30/sup 0/K.

Research Organization:
Univ. of California, Livermore
OSTI ID:
5414393
Journal Information:
EOS, Trans., Am. Geophys. Union; (United States), Vol. 57:12; Conference: AGU fall annual meeting, San Francisco, CA, USA, 6 Dec 1976
Country of Publication:
United States
Language:
English