Evaluation of a linear photodiode array detector for synchrotron small-angle x-ray scattering measurements

Journal Article · Sun Oct 01 00:00:00 EDT 1989 · Review of Scientific Instruments; (USA)

DOI:https://doi.org/10.1063/1.1140556· OSTI ID:5413122

Chu, B; Wu, D Q ^[1]; Howard, R L ^[2]

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1. Department of Chemistry, State University of New York at Stony Brook, Stony Brook, New York 11794-3400 (US)
2. EG G Princeton Applied Research, Scientific Instruments Division, P. O. Box 2565, Princeton, New Jersey 08543-2565

A linear photodiode array position-sensitive detector for synchrotron small-angle x-ray scattering was constructed by coupling a fiber-optic face plate coated with a thin layer ({similar to}40 {mu}m) of phosphor (Y{sub 2}O{sub 2}S:Tb) onto an electrostatically focused, intensified photodiode array detector (EG G, PARC, Model 1422) originally designed for visible light applications. The x-ray detector was thoroughly evaluated. It showed excellent linearity of response to the incident x-ray intensity (less than 1%), stable pixel uniformity (an average of {plus minus}5%), good spatial linearity ({plus minus}1 per 100 pixels), and a net gain of {similar to}17 counts/x-ray photon at 8 keV. The detector quantum efficiency was about 1 for a signal-to-noise ratio of greater than {similar to}5%. No damage to individual pixels was found after exposure to a main beam of {similar to}10{sup 10} x-ray photons/mm{sup 2}/s. A finite afterglow ({approx gt}5 s) was observed for the phosphor inside the intensifier tube. The afterglow that could limit fast time-resolved experiments could be significantly improved by replacing the present intensifier with one using a fast-decay phosphor. The detector usable length could be increased from the present 25 to 50 mm by replacing the fiber-optic face plate with a 2:1 taper.

• OSTI ID: 5413122
• Journal Information: Review of Scientific Instruments; (USA), Vol. 60:10; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
PHOTODIODES
FABRICATION
RADIATION DETECTORS
X-RAY DIFFRACTION
ELECTROSTATICS
FIBER OPTICS
FOCUSING
PHOSPHORS
PLATES
SMALL ANGLE SCATTERING
SYNCHROTRON RADIATION
TERBIUM ADDITIONS
YTTRIUM OXIDES
YTTRIUM SULFIDES
ALLOYS
BREMSSTRAHLUNG
CHALCOGENIDES
COHERENT SCATTERING
DIFFRACTION
ELECTROMAGNETIC RADIATION
MEASURING INSTRUMENTS
OXIDES
OXYGEN COMPOUNDS
RADIATIONS
RARE EARTH ADDITIONS
RARE EARTH ALLOYS
SCATTERING
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SULFIDES
SULFUR COMPOUNDS
TERBIUM ALLOYS
TRANSITION ELEMENT COMPOUNDS
YTTRIUM COMPOUNDS
420800* - Engineering- Electronic Circuits & Devices- (-1989)