Probabilistic description of particle transport. II. Analysis of low-energy electron transmission through thin solid Xe and N/sub 2/ films
Journal Article
·
· Phys. Rev. A; (United States)
The probabilistic description of quasielastic particle transport given in a previous paper is used to analyze the results of low-energy electron transmission experiments on thin solid xenon and molecular nitrogen films deposited on a metal substrate. Values of the entrance probabilities of the incident electrons at the vacuum-film interface and of the electron scattering mean free paths in the films are extracted in the electron energy range 1.6--7.9 eV for xenon, and 2.4--7.4 eV for molecular nitrogen. The effects of anisotropy in the surface scattering and in the reflections at the two interfaces of the films are also discussed.
- Research Organization:
- Departement de Medecine Nucleaire et de Radiobiologie, Faculte de Medecine, Universite de Sherbrooke, Sherbrooke, Quebec, Canada J1H5N4
- OSTI ID:
- 5400476
- Journal Information:
- Phys. Rev. A; (United States), Vol. 37:6
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
73 NUCLEAR PHYSICS AND RADIATION PHYSICS
ELECTRONS
TRANSMISSION
NITROGEN
CHARGED-PARTICLE TRANSPORT
XENON
EV RANGE 01-10
FILMS
INTERFACES
MEAN FREE PATH
SOLIDS
ELEMENTARY PARTICLES
ELEMENTS
ENERGY RANGE
EV RANGE
FERMIONS
FLUIDS
GASES
LEPTONS
NONMETALS
RADIATION TRANSPORT
RARE GASES
654001* - Radiation & Shielding Physics- Radiation Physics
Shielding Calculations & Experiments
ELECTRONS
TRANSMISSION
NITROGEN
CHARGED-PARTICLE TRANSPORT
XENON
EV RANGE 01-10
FILMS
INTERFACES
MEAN FREE PATH
SOLIDS
ELEMENTARY PARTICLES
ELEMENTS
ENERGY RANGE
EV RANGE
FERMIONS
FLUIDS
GASES
LEPTONS
NONMETALS
RADIATION TRANSPORT
RARE GASES
654001* - Radiation & Shielding Physics- Radiation Physics
Shielding Calculations & Experiments