Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Anisotropic Upper Critical Field of LuNi{sub 2}B{sub 2}C

Journal Article · · Physical Review Letters
; ; ; ;  [1];  [2]
  1. Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
  2. Ames Laboratory and Department of Physics and Astronomy, Iowa State University, Ames, Iowa 50011 (United States)
The upper critical field, H{sub c2} , of LuNi{sub 2}B{sub 2}C has been determined from the temperature dependence of the magnetization. A temperature dependent anisotropy within the basal plane which decreases from a value of 1.1 at 4.5K to a value of 1.0 at T{sub c} and an almost temperature independent out-of-plane anisotropy have been observed. Near T{sub c} the upper critical field along all directions shows a strong upward curvature. These features of H{sub c2} can be explained quantitatively using a nonlocal extension of the Ginzburg-Landau equations. The Fermi velocity averages determined from these measurements and those obtained in band structure calculations are in good agreement. {copyright} {ital 1997} {ital The American Physical Society}
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
538641
Journal Information:
Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 9 Vol. 79; ISSN 0031-9007; ISSN PRLTAO
Country of Publication:
United States
Language:
English

Similar Records

Scanning Tunneling Microscopy Observation of a Square Abrikosov Lattice in LuNi{sub 2}B{sub 2}C
Journal Article · Sun Jun 01 00:00:00 EDT 1997 · Physical Review Letters · OSTI ID:656098

Temperature and angular dependences of upper critical fields for the layer structure superconductor 2H--NbSe/sub 2/
Journal Article · Sun Oct 31 23:00:00 EST 1976 · J. Low Temp. Phys.; (United States) · OSTI ID:7133741

Transport and superconducting properties of RNi{sub 2}B{sub 2}C (R=Y, Lu) single crystals
Journal Article · Mon Mar 31 23:00:00 EST 1997 · Physical Review, B: Condensed Matter · OSTI ID:537230