Charged particle beam apparatus
This patent describes a charged particle beam apparatus comprising first means for generating a beam of charged particles, second means for directing the beam toward a target, a tube having a longitudinal bore, the bore forming a vacuum envelope, and the beam travelling through the bore, and third means disposed outside the tube for generating a variable magnetic beam deflection field for the beam within the tube. The improvement comprises the tube including a first metal section, a second metal section, and a non-conductive section containing a grounded, helically wound conductive filament disposed between the first and the second sections, the filament being closely wound, wherein eddy currents induced in the helically wound conductive filament by the variable magnetic beam deflection field are impeded between adjacent turns of the helically wound filament, and wherein the helically wound conductive filament is connected respectively at opposite ends to the fist section and the second section.
- Assignee:
- U.S. Philips Corp., New York, NY
- Patent Number(s):
- US 4701623
- OSTI ID:
- 5376507
- Country of Publication:
- United States
- Language:
- English
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