Process monitoring using optical ultrasonic wave detection

Conference · Sat Dec 31 23:00:00 EST 1988

DOI:https://doi.org/10.1007/978-1-4684-5772-8_265· OSTI ID:5376156

Telschow, K. L.; Walter, J. B.; Garcia, G. V.; Kunerth, D. C.

Optical ultrasonic wave detection techniques are being developed for process monitoring. An important limitation on optical techniques is that the material surface, in materials processing applications, is usually not a specular reflector and in many cases is totally diffusely reflecting. This severely degrades the light collected by the detection optics, greatly reducing the intensity and randomly scattering the phase of the reflected light. A confocal Fabry-Perot interferometer, which is sensitive to the Doppler frequency shift resulting from the surface motion and not to the phase of the collected light, is well suited to detecting ultrasonic waves in diffusely reflecting materials. This paper describes the application of this detector to the real-time monitoring of the sintering of ceramic materials. 8 refs., 5 figs.

• Research Organization: EG and G Idaho, Inc., Idaho Falls, ID (USA)
• Sponsoring Organization: DOE/NE; DOI
• DOE Contract Number: AC07-76ID01570
• OSTI ID: 5376156
• Report Number(s): EGG-M-89119; CONF-890770--2; ON: DE90002021
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360201* -- Ceramics
Cermets
& Refractories-- Preparation & Fabrication
360203 -- Ceramics
Cermets
& Refractories-- Mechanical Properties
440300 -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
ARGON
CERAMICS
CHALCOGENIDES
COMPARATIVE EVALUATIONS
CONTROL
CRYSTAL STRUCTURE
DATA ANALYSIS
DENSITY
ELEMENTS
EQUIPMENT
FABRICATION
FABRY-PEROT INTERFEROMETER
FLUIDS
GASES
INTERFEROMETERS
LASERS
MEASURING INSTRUMENTS
MECHANICAL PROPERTIES
MICROSTRUCTURE
MONITORING
NEODYMIUM LASERS
NITRIDES
NITROGEN COMPOUNDS
NONMETALS
OPTICAL EQUIPMENT
OPTICAL PROPERTIES
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
PNICTIDES
PROCESS CONTROL
RARE GASES
REAL TIME SYSTEMS
REFRACTIVITY
SILICON COMPOUNDS
SILICON NITRIDES
SINTERING
SOLID STATE LASERS
SOUND WAVES
TESTING
ULTRASONIC WAVES
ZINC COMPOUNDS
ZINC OXIDES