Nonresonant detection of Josephson radiation from thin-film microbridges

Journal Article · Wed Nov 30 23:00:00 EST 1977 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.323542· OSTI ID:5359668

Soerensen, O H; Mygind, J; Pedersen, N F; Gubankov, V N; Levinsen, M T; Lindelof, P E

Measurements are reported of the Josephson radiation from microbridges coupled to an X-band receiver via a nonresonant microwave transformer. Although closely coupled to the bridge, the transformer does not modify the bridge properties. We find that near the transition temperature the radiation linewidth is proportional to the square of the dynamic resistance, which is also predicted by the resistively shunted junction model. The effective noise temperature determined by the linewidth is 19 +- 3 K and the measured maximum integral power is 5 x 10/sup -12/ W.

• Research Organization: Physics Laboratory I, The Technical University of Denmark, DK-2800 Lyngby, Denmark
• OSTI ID: 5359668
• Journal Information: J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 48:12; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ELECTRIC BRIDGES
ELECTRIC CONDUCTIVITY
ELECTRICAL EQUIPMENT
ELECTRICAL PROPERTIES
ELECTROMAGNETIC RADIATION
EQUIPMENT
FILMS
JOSEPHSON EFFECT
JOSEPHSON JUNCTIONS
MICROWAVE RADIATION
NOISE
PHYSICAL PROPERTIES
RADIATIONS
SUPERCONDUCTING JUNCTIONS
SUPERCONDUCTIVITY
TEMPERATURE NOISE
THERMODYNAMIC PROPERTIES
TRANSITION TEMPERATURE
WAVEGUIDES