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Title: Measurement of charge-carrier concentration in indium phosphide by means of an electrolyte-semiconductor contact

Journal Article · · Sov. Phys. J. (Engl. Transl.); (United States)
DOI:https://doi.org/10.1007/BF00900095· OSTI ID:5355181

An electrolyte-semiconductor contact is used to study the conductivity of epitaxial layers and single crystals of n-type indium phosphide obtained by gas transport. Some of the specimens were alloyed with tin and sulfur. The volt-farad characteristics are used to find the potentials of planar zones, which amount to 0.8-1.3 V for different electrolytes. Values of concentration of charge carriers calculated from measured values of capacitance of the electrolyte-indium-phosphide contact showed good agreement with measurements of the Hall effect on single crystals in the range 10/sup 16/-10/sup 18/ cm/sup -3/. The use of measurements of the capacitance of the electrolyte-semiconductor contact with simultaneous etching of a local region made it possible to study the electron distribution in epitaxial layers of indium phosphide.

OSTI ID:
5355181
Journal Information:
Sov. Phys. J. (Engl. Transl.); (United States), Vol. 30:5; Other Information: Translated from Izv. Vyssh. Uchebon. Zaved., Fiz.; 30: No. 5, 71-74(May 1987)
Country of Publication:
United States
Language:
English