Chaos in pulse-driven Josephson junctions

Journal Article · Tue Mar 01 04:00:00 EST 1988 · Phys. Rev. B: Condens. Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.37.3778· OSTI ID:5353684

Sobolewski, R; Dykaar, D R; Hsiang, T Y; Vanneste, C; Chi, C

We report experimental and numerical studies of chaotic behavior in Josephson tunnel junctions driven by a train of picosecond electrical pulses. Dramatic changes were observed in both the experimental and simulated current-voltage characteristics, demonstrating that periodic wide-band excitations can temporarily alter the junction dynamics, leading to intermittent chaotic behavior. We relate the observed chaotic behavior to the junction switching processes in the regime of very short current pulses.

• Research Organization: Department of Electrical Engineering, The University of Rochester, Rochester, New York 14627
• OSTI ID: 5353684
• Journal Information: Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 37:7; ISSN PRBMD
• Country of Publication: United States
• Language: English

Related Subjects

420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
JOSEPHSON JUNCTIONS
JUNCTIONS
OSCILLATIONS
PHYSICAL PROPERTIES
PULSES
SUPERCONDUCTING JUNCTIONS