Application of analytical electron microscopy to the study of intergranular corrosion in 304 stainless steel

Conference · Tue Jan 01 00:00:00 EST 1980

OSTI ID:5348370

Pande, C S; Sabatini, R L

The technique of analytical electron microscopy in a scanning transmission electron microscope fitted with an energy dispersive x-ray spectrometer is used to measure the chromium depletion in sensitized 304 stainless steel along the grain boundaries. It is shown that such measurements could be misleading unless care is taken to properly choose the regions on the grain boundaries for such analysis.

• Research Organization: Brookhaven National Lab., Upton, NY (USA)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 5348370
• Report Number(s): BNL-27344; CONF-800801-5; TRN: 80-012591
• Resource Relation: Conference: Annual meeting of the Electron Microscopy Society of America and 15. Microbeam Analysis Society Conference, San Francisco, CA, USA, 4 Aug 1980
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
STAINLESS STEEL-304
GRAIN BOUNDARIES
INTERGRANULAR CORROSION
CHROMIUM
QUANTITY RATIO
ALLOYS
CHEMICAL REACTIONS
CHROMIUM ALLOYS
CHROMIUM STEELS
CHROMIUM-NICKEL STEELS
CORROSION
CORROSION RESISTANT ALLOYS
CRYSTAL STRUCTURE
ELEMENTS
HEAT RESISTANT MATERIALS
HEAT RESISTING ALLOYS
IRON ALLOYS
IRON BASE ALLOYS
MATERIALS
METALS
MICROSTRUCTURE
NICKEL ALLOYS
STAINLESS STEELS
STEELS
TRANSITION ELEMENTS
360105* - Metals & Alloys- Corrosion & Erosion