Extended x-ray absorption fine structure study of incorporation of Bi and Pb atoms into the crystal structure of Ba{sub 4.5}Nd{sub 9}Ti{sub 18}O{sub 54}

Journal Article · Sat Mar 01 04:00:00 EST 1997 · Journal of Materials Research

DOI:https://doi.org/10.1557/JMR.1997.0116· OSTI ID:534466

Valant, M; Arcon, I; Suvorov, D; Kodre, A ^[1]; Negas, T ^[2]; Frahm, R ^[3]

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1. Jozef Stefan Institute, Jamova 39, 1000 Ljubljana, University of Ljubljana (Slovenia)
2. Trans-Tech Inc., Adamstown, Maryland 21702 (United States)
3. Hambruger Synchrotronstrahlungslabor at Deutsches Elektronen Synchrotron DESY, Hamburg (Germany)

In extended x-ray aborption fine structure (EXAFS) study of local environment of Bi{sup 3+} and Pb{sup 2+} ions incorporated in Ba{sub 4.5}Nd{sub 9}Ti{sub 18}O{sub 54} actual sites of Bi- and Pb-incorporated are determined. Evidences are given that dopant ions are not distributed randomly on all theoretically possible sites: Bi{sup 3+} selectively enters one out of three posible channels, corresponding to the sites x=0.9484, y=0.2500, z=0.2939, and/or x=0.0455, y=0.2500, z=0.6928 previously occupied by Nd{sup 3+}, while Pb{sup 2+} selectively enters site x=0.4940, y=0.2500, z=0.4993 previously shared by Ba{sup 2+} and Nd{sup 3+}. {copyright} {ital 1997 Materials Research Society.}

• OSTI ID: 534466
• Journal Information: Journal of Materials Research, Journal Name: Journal of Materials Research Journal Issue: 3 Vol. 12; ISSN JMREEE; ISSN 0884-2914
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BARIUM OXIDES
BISMUTH ADDITIONS
CERAMICS
CRYSTAL STRUCTURE
DIELECTRIC MATERIALS
LEAD ADDITIONS
NEODYMIUM OXIDES
SOLID SOLUTIONS
TITANIUM OXIDES
X-RAY SPECTROSCOPY